The Structural and Electron Field Emission Properties of Ion- Beam-Synthesised Metallic-Dielectric Nanocomposites
نویسنده
چکیده
Metallic-dielectric nanocomposites, including Ag-SiO2, Co-SiO2 and WC-SiC, were synthesised on silicon substrates using ion implantation. The electron field emission (FE) properties of these nanocomposites were studied and correlated to their microstructure determined from the measurements of atomic force microscopy, Rutherford backscattering spectroscopy, x-ray photoelectron spectroscopy and transmission electron microscopy. These nanocomposites exhibit excellent FE properties and give an emission current of 1 nA at the applied electric fields as low as 5 V/μm for Co-SiO2 nanocomposite layers. Moreover, the results are clearly shown that isolated metallic clusters embedded in a relatively electrically insulating matrix can create local field enhancement on the samples attributed to the electrical inhomogeneity effect. Reviews on Advanced Materials Science W.M. Tsang et al 2 12/02/2013
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